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Geodynamics Laboratories

Scanning electron microscopy

Scanning electron microscopy is a key analytical method in the geosciences for the high-resolution analysis of solids. It provides detailed insights into surface structure, microstructure and texture down to the nanometre range. In combination with energy dispersive X-ray spectroscopy (EDX), the SEM also allows qualitative and semi-quantitative chemical characterisation of mineral phases and crystal orientations can be analysed using backscattered electron diffraction (EBSD). Cathodoluminescence (CL) allows high-resolution imaging of trace element distribution and defect structure. The method is used in research and teaching, including in structural geology, petrology, mineralogy, sedimentology and material characterisation.

– 0.5 kV – 30 kV, 100 nA
– Low vacuum imaging in N<sub>2</sub> and H<sub>2</sub>O
– Everhart-Thornley/ET (high vacuum) and gaseous/GSD (low vacuum) secondary electron/SE detectors
– Low energy backscattered electron/BSE detector
– Energy-filtered, in-column detection and low-kV imaging (phase contrast and topography)
– CMOS-based, fast electron backscatter diffraction/EBSD (Oxford Instruments Symmetry2)
– 100 mm<sup>2</sup> energy dispersive X-ray spectrometer/EDX (Oxford Instruments Ultimax 100)
– Cathodoluminescence/CL (Delmic Sparc Compact), PMT (~200 nm – 850 nm), optionally wavelength-filtered with various bandpass filters (5-100 nm width), high-pass or low-pass filters
– Large-area panoramic imaging (electron images, EDX, EBSD, CL)

– Non-destructive cutting of samples at low speed
– High-vacuum impregnation of samples
– polished thin sections or samples embedded in resin (up to 1/4 µm diamond), also anhydrous
– Chemical polishing (colloidal silicon dioxide)
– High-vacuum carbon coating

Contact: ruediger.kilian@geo.uni-halle.de

Geomaterial analytics/Analytics4Geomaterials (gema-lab)

gema-lab