Spectrometer: Energy dispersive XRF Minipal
The sample material is excited to emit its own radiation using X-rays. As each element present in the sample emits its characteristic fluorescent radiation, the method is suitable for qualitative analysis. In general, there is a linear proportional relationship between the intensity of the emitted X-rays and the element concentration in the sample, so that quantitative element analysis is also possible with appropriate calibration. In this energy-dispersive device, the radiation in the semiconductor detector is split according to its energy.
- Power: max. 9W (4-30 kV; 0.001-1 mA) Rhodium tube
- Detector: SDD (Si drift detector)
- Detector resolution < 160 eV (et) MnKα dynamic range 90 kcps (linear up to 60 kcps)
- Energy range 0-24 keV
- Sample changer 12 positions
- Sample turner available
- Filter 5: Kapton, Al-thin, Al, Mo, Ag
- Purging system helium or air
- Sample types – loose or pressed powders (wax tablets) – solids (27-42 mm ø), melts – liquids (5-10 ml)
